Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2004-12-03
2009-02-17
Vu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S257000
Reexamination Certificate
active
07491997
ABSTRACT:
A memory device and a method of fabricating the same are provided. The method includes forming a gate stack on a semiconductor substrate and partially exposing upper end portions of the semiconductor substrate by etching the gate stack to form a gate stack structure, and implanting a dopant into the exposed portions of the semiconductor substrate to form source and drain regions, wherein the gate stack structure is etched such that its width increases from top to bottom. Accordingly, it is possible to manufacture a memory device with high integration, using a simplified manufacture process.
REFERENCES:
patent: 3793090 (1974-02-01), Barile et al.
patent: 3882469 (1975-05-01), Gosney, Jr.
patent: 5966603 (1999-10-01), Eitan
patent: 6271094 (2001-08-01), Boyd et al.
patent: 6388293 (2002-05-01), Ogura et al.
patent: 6465837 (2002-10-01), Wu
patent: 6610586 (2003-08-01), Liu
patent: 6900098 (2005-05-01), Ogura et al.
patent: 2003/0094647 (2003-05-01), Osabe et al.
patent: 1 041 642 (2000-10-01), None
Second Office Action issued in Chinese Patent Application No. 2004100983589 on Jul. 27, 2007, with English Translation.
Kim Won-joo
Seo Sun-ae
Song In-jae
Buchanan & Ingersoll & Rooney PC
Samsung Electronics Co,. Ltd.
Vu David
LandOfFree
Memory device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Memory device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory device and method of manufacturing the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4119335