Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-04-03
2007-04-03
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
10454400
ABSTRACT:
Memory apparatus and methods utilize permuting status patterns. A memory agent may include a pattern generator capable of generating permuting status patterns. A system may include first and second memory agents that send data and permuting status patterns over the same link.
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Alexander James W.
Vogt Pete D.
Intel Corporation
Marger Johnson & McCollom PC
Tu Christine T.
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