Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-02-14
2006-02-14
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S316000, C438S257000
Reexamination Certificate
active
06998669
ABSTRACT:
In a floating gate memory cell including a floating gate separated from an active region by a tunnel isolation region, a first one of the active region and the floating gate comprises a portion that protrudes towards a second one of the active region and the floating gate. In some embodiments, the protruding portion tapers toward the second one of the active region and the floating gate. The tunnel insulation layer may be narrowed at the protruding portion. Protruding portions may be formed on both the floating gate and the active region.
REFERENCES:
patent: 6706592 (2004-03-01), Chern et al.
patent: 2004/0084713 (2004-05-01), Hsieh
Choi Jeong-Hyuk
Lee Jae-Duk
Park Dong-gun
Myers Bigel & Sibley & Sajovec
Nelms David
Samsung Electronics Co,. Ltd.
Tran Long
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