Memory bit line leakage repair

Static information storage and retrieval – Read/write circuit – Precharge

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S154000, C365S206000

Reexamination Certificate

active

06950359

ABSTRACT:
Techniques for replacing and eliminating paths causing channel leakage current. In one embodiment, one or more precharge enable transistors and a precharge enable signal are added to a circuit configuration. The precharge enable transistors are designed to remain on and simply pass a signal in a properly functioning path. When a leakage path is identified, such as during IDDQ testing, the precharge enable signal is set to turn off the precharge enable transistors. When the precharge enable transistors are off, the leakage path is disrupted, and the leakage current stopped. The path may be replaced with a redundant path.

REFERENCES:
patent: 4943960 (1990-07-01), Komatsu et al.
patent: 5673231 (1997-09-01), Furutani
patent: 5757816 (1998-05-01), Al-Assadi et al.
patent: 5835429 (1998-11-01), Schwarz
patent: 5923601 (1999-07-01), Wendell
patent: 2002/0089879 (2002-07-01), Kobayashi et al.
patent: 2004/0042333 (2004-03-01), Shore et al.
patent: 0642137 (1994-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Memory bit line leakage repair does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory bit line leakage repair, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory bit line leakage repair will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3422852

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.