Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate
2006-08-15
2006-08-15
Tran, Andrew Q. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having particular data buffer or latch
C365S222000
Reexamination Certificate
active
07092300
ABSTRACT:
Memory apparatus having a short word line cycle time and method for operating a memory apparatus. One embodiment provides a memory apparatus comprising at least one cell array having a multiplicity of memory cells, with each of the memory cells having an associated word line and an associated bit line; a control device which has a signaling connection to the word lines and to the bit lines and is configured to read data stored in the memory cells and to write data to the memory cells; wherein the control device is configured to execute a destructive read command (DRD) for reading data from at least one of the memory cells, comprising: electrically biasing a bit line associated with the at least one memory cell, opening a word line associated with the at least one memory cell, and destructively reading data stored in the at least one memory cell.
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German Examination Report dated Apr. 14, 2003.
Dortu Jean-Marc
Spirkl Wolfgang
Infineon - Technologies AG
Patterson & Sheridan L.L.P.
Tran Andrew Q.
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