Measuring apparatus, measuring method, and test apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S12100R

Reexamination Certificate

active

11497506

ABSTRACT:
There is provided a measuring apparatus that generates a first strobe signal and a second strobe signal in synchronization with an output signal, sequentially changes phases of the strobe signals whenever the electronic device outputs the output signal multiple times, acquires a signal level of the output signal at each phase of the strobe signals by the multiple times, counts the number of times by which the signal level of the output signal to the first strobe signal is a High level for each phase of the first strobe signal, counts the number of times by which the signal level of the output signal to the second strobe signal is a Low level for each phase of the second strobe signal, and computes a phase of a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter based on the counted number of times. The measuring apparatus measures a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter by one-time test.

REFERENCES:
patent: 6016565 (2000-01-01), Miura
patent: 6479983 (2002-11-01), Ebiya
patent: 6865698 (2005-03-01), Housako
patent: 7196534 (2007-03-01), Oshima
patent: 2001/0052097 (2001-12-01), Miura
patent: 2004/0122620 (2004-06-01), Doi et al.
patent: 53-102784 (1978-09-01), None
patent: WO-02/103379 (2002-12-01), None
International Search Report issued in International application No. PCT/JP2005/001497 mailed on May 17, 2005 and English translation thereof, 2 pages.

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