Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-28
2007-08-28
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S12100R
Reexamination Certificate
active
11497506
ABSTRACT:
There is provided a measuring apparatus that generates a first strobe signal and a second strobe signal in synchronization with an output signal, sequentially changes phases of the strobe signals whenever the electronic device outputs the output signal multiple times, acquires a signal level of the output signal at each phase of the strobe signals by the multiple times, counts the number of times by which the signal level of the output signal to the first strobe signal is a High level for each phase of the first strobe signal, counts the number of times by which the signal level of the output signal to the second strobe signal is a Low level for each phase of the second strobe signal, and computes a phase of a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter based on the counted number of times. The measuring apparatus measures a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter by one-time test.
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International Search Report issued in International application No. PCT/JP2005/001497 mailed on May 17, 2005 and English translation thereof, 2 pages.
Niijima Hirokatsu
Yamane Tomoyuki
Benitez Joshua
Nguyen Ha Tran
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