4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Tomoyuki Yamane

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Measuring apparatus, measuring method, and test apparatus

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor memory test apparatus and method for address...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3036461

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