Measurement system

Details Measurement system Measurement system

1980-01-28

1983-02-08

Punter, William H.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356371, 356393, G01B 1106, G01B 908, G01B 1130

Patent

active

RE0311430

ABSTRACT:
A microscope-projector system is employed to image and view a transition of light and dark areas on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope-projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect to a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thickness of the object, and also to automatically readjust the position of the shadow to a reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.

REFERENCES:
patent: 2976762 (1961-03-01), Imshaug
patent: 3016464 (1962-01-01), Bailey
patent: 3022578 (1962-02-01), Seibel
patent: 3187185 (1965-06-01), Milnes
patent: 3794427 (1974-02-01), Shibata et al.
patent: 3976382 (1976-08-01), Westby
patent: 4027978 (1977-06-01), Yamamoto et al.

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