Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1992-08-19
1994-03-01
Evans, F. L.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
G01B 1106
Patent
active
052912710
ABSTRACT:
Apparatus for measuring sidewall thickness of transparent containers that includes a source for directing a light beam onto the outer surface of the container sidewall at an angle such that a portion of the light beam is reflected from the outer sidewall surface, and a portion is refracted into the container sidewall, reflected from the inner sidewall surface and then re-emerges from the outer sidewall surface. A lens is disposed between a linear array light sensor and the container sidewall for focusing light energy reflected from the outer and inner sidewall surfaces onto the sensor. The lens has an image plane in which the sensor is disposed and an object plane co-linear with the light beam. Electronics is responsive to light energy incident on the sensor for determining wall thickness of the container between the inner and outer sidewall surfaces.
REFERENCES:
patent: 3807870 (1974-04-01), Kalman
patent: 3994599 (1976-11-01), Southwell
patent: 4902902 (1990-02-01), Tole
Zeiss brochure "Light-section Microscope" undated.
Degenhard, "Light-Section Microscope Measures Thin Film-Thickness" undated.
Honeywell "Visitronic 100 Series" brochure undated.
Control Optics "Laser Thickness Gauges-General Specification", undated.
Juvinall John W.
Kistler Steven D.
Ringlien James A.
Evans F. L.
Owens-Brockway Glass Container Inc.
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