Mask patterns including gel layers for semiconductor device...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S270100, C430S014000

Reexamination Certificate

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07985529

ABSTRACT:
Mask patterns include a resist pattern and a gel layer on a surface of the resist pattern having a junction including hydrogen bonds between a proton donor polymer and a proton acceptor polymer. Methods of forming the mask patterns and methods of fabricating a semiconductor device using the mask patterns as etching masks are also provided.

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Japanese Office Action corresponding to Japanese Application No. 2005-276472 mailed Nov. 22, 2010.

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