Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2011-07-26
2011-07-26
Kelly, Cynthia H (Department: 1722)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S270100, C430S014000
Reexamination Certificate
active
07985529
ABSTRACT:
Mask patterns include a resist pattern and a gel layer on a surface of the resist pattern having a junction including hydrogen bonds between a proton donor polymer and a proton acceptor polymer. Methods of forming the mask patterns and methods of fabricating a semiconductor device using the mask patterns as etching masks are also provided.
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Hah Jung-Hwan
Hata Mitsuhiro
Kim Hyun-woo
Woo Sang-gyun
Eoff Anca
Kelly Cynthia H
Myers Bigel & Sibley Sajovec, PA
Samsung Electronics Co,. Ltd.
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