Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2008-06-26
2009-11-17
Chowdhury, Tarifur R. (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
07619730
ABSTRACT:
Methods, systems, program storage devices and computer program products for mask inspection that automate the detection and placement of do not inspect regions (“DNIR”) for intentionally induced defects on masks. A location of an intentional defect is identified on a mask, and then logic relating to this location is translated into a shape that represents a DNIR for the intentional defect. A second shape representing another DNIR of the mask is provided. It is then determined if the first and second shapes for DNIRs violate a processing rule of the inspection tool, and if so, the violated rule is corrected for by generating a single contiguous DNIR by overlapping the first and second shapes. The inspection tool then utilizes the first and second shapes representing DNIRs, along with any single contiguous DNIRs, to inspect the mask for unintentional defects while avoiding intentional defects.
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Badger Karen D.
Katcoff David L.
Lissor Jeffrey P.
Magg Christopher K.
Akanbi Isiaka O
Chowdhury Tarifur R.
DeLio & Peterson LLC
International Business Machines - Corporation
Kotulak Richard
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