Marking semiconductor devices through a mount tape

Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure

Reexamination Certificate

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C219S121620, C219S121680, C264S400000, C264S482000, C257S797000

Reexamination Certificate

active

06972244

ABSTRACT:
Wafer level techniques for marking the back surfaces of integrated circuit devices are described. The back surface of the wafer is laser marked while being supported by a mount tape. In some embodiments, the mount tape is sufficiently transparent that the laser light passes through the mount tape and marks the back surface of the wafer. In other embodiments, the laser may actually burn the mounting tape (or portions thereof) during the marking process. The marking may be done on any suitable back surface material including polymeric backcoatings, metalized films or directly on semiconductor materials.

REFERENCES:
patent: 4285433 (1981-08-01), Garrett et al.
patent: 4442137 (1984-04-01), Kumar
patent: 4585931 (1986-04-01), Duncan et al.
patent: 4945204 (1990-07-01), Nakamura et al.
patent: 5329090 (1994-07-01), Woelki et al.
patent: 5357077 (1994-10-01), Tsuruta
patent: 5597767 (1997-01-01), Mignardi et al.
patent: 5923995 (1999-07-01), Kao et al.
patent: 6023094 (2000-02-01), Kao et al.
patent: 6175162 (2001-01-01), Kao et al.
patent: 6214703 (2001-04-01), Chen et al.
patent: 6610167 (2003-08-01), Glenn et al.
patent: 6709953 (2004-03-01), Vasquez et al.
patent: 6781093 (2004-08-01), Conlon et al.
patent: 6806725 (2004-10-01), Tsui et al.
patent: 2001/0040152 (2001-11-01), Higashi et al.
patent: 2002/0139235 (2002-10-01), Nordin et al.
patent: 2003/0143819 (2003-07-01), Hedler et al.
patent: 2004/0161876 (2004-08-01), Tandy et al.
patent: 2004/0207836 (2004-10-01), Chhibber et al.
patent: 2004/0224483 (2004-11-01), Takyu et al.
patent: 2005/0070095 (2005-03-01), Sharan et al.
patent: 2005/0109742 (2005-05-01), Nagai et al.
patent: 54-131537 (1979-10-01), None
Wong et al. “Laser chip separation method for GaAs mmic wafers” IEEE 1988 Microwave and millimeter-wave monolithic circuits symposium, CH2591-6/880000-0113 Jun. 1988 p. 113-116.
Wang et al. “The coming of CSP” IEEE Robotics and automation magazine 1070-9932/04 Mar. 2004 p. 59-69.

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