Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate
2005-12-06
2005-12-06
Baumeister, B. William (Department: 2891)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having specified scribe region structure
C219S121620, C219S121680, C264S400000, C264S482000, C257S797000
Reexamination Certificate
active
06972244
ABSTRACT:
Wafer level techniques for marking the back surfaces of integrated circuit devices are described. The back surface of the wafer is laser marked while being supported by a mount tape. In some embodiments, the mount tape is sufficiently transparent that the laser light passes through the mount tape and marks the back surface of the wafer. In other embodiments, the laser may actually burn the mounting tape (or portions thereof) during the marking process. The marking may be done on any suitable back surface material including polymeric backcoatings, metalized films or directly on semiconductor materials.
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Goh Tian Oon
How You Chye
Kelkar Nikhil Vishwanath
Low Soi Chong
Patwardhan Viraj A.
Baumeister B. William
Beyer Weaver & Thomas LLP
Lee, Jr. Granvill D.
National Semiconductor Corporation
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