Manufacturing method of thin film transistor substrate

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S199000, C438S201000, C438S223000, C438S227000

Reexamination Certificate

active

06864134

ABSTRACT:
This invention provides a manufacturing method for fabricating on the same substrate both high voltage thin film transistors suitable for driving liquid crystal and low voltage drive high performance thin film transistors. In addition, this invention provides a thin film transistor substrate where the area occupied by a storage capacitor in each pixel is reduced to raise the aperture ratio of the display unit.One aspect of this invention provides a manufacturing method characterized in that the impurity regions of both high voltage thin film transistors and high performance thin film transistors which differ in the thickness of gate insulation are formed by implanting a dopant through the same two-layered film. Another aspect of this invention reduces the area occupied by the drive circuit in the display unit by utilizing an extension of one layer of the insulation film included in each thin film transistor.

REFERENCES:
patent: 5563440 (1996-10-01), Yamazaki et al.
patent: 6306693 (2001-10-01), Ishiguro et al.
patent: 6362030 (2002-03-01), Nagayama et al.
patent: 6462723 (2002-10-01), Yamazaki et al.
patent: 6506642 (2003-01-01), Luning et al.
patent: 6528852 (2003-03-01), Takemura
patent: 6635505 (2003-10-01), Tanaka et al.
patent: 6646288 (2003-11-01), Yamazaki et al.
patent: 6706544 (2004-03-01), Yamazaki et al.
patent: 6781646 (2004-08-01), Kawachi et al.
patent: 20020179908 (2002-12-01), Arao
patent: 20030124778 (2003-07-01), Doi et al.
patent: 20030151049 (2003-08-01), Hotta et al.
patent: 20030170938 (2003-09-01), Takahashi
patent: 5-335573 (1993-12-01), None
patent: 11-163366 (1999-06-01), None
Asia Display, IDW '01 Proceedings, p. 319.-322.
Asia Display, IDW '01 Proceedings, p. 323-326.

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