Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-08-10
2009-12-29
Nguyen, Ha Tran T (Department: 2829)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S167000, C257S471000
Reexamination Certificate
active
07638403
ABSTRACT:
An integrated circuit structure is described, and includes a substrate, a contact window, and a Schottky contact metal layer. A heavily doped region and a lightly doped region are formed in the substrate. The contact window is disposed above the heavily doped region, and the Schottky contact metal layer is disposed above the lightly doped region. The Schottky contact metal layer and the substrate form a Schottky diode. The material of the contact window is different from that of the Schottky contact metal layer.
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Chinese 4th Examination Report of China Application No. 2006100754875, dated Jun. 19, 2009.
Campbell Shaun
J.C. Patents
Nguyen Ha Tran T
United Microelectronics Corp.
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