Manufacturing method of integrated circuit structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S167000, C257S471000

Reexamination Certificate

active

07638403

ABSTRACT:
An integrated circuit structure is described, and includes a substrate, a contact window, and a Schottky contact metal layer. A heavily doped region and a lightly doped region are formed in the substrate. The contact window is disposed above the heavily doped region, and the Schottky contact metal layer is disposed above the lightly doped region. The Schottky contact metal layer and the substrate form a Schottky diode. The material of the contact window is different from that of the Schottky contact metal layer.

REFERENCES:
patent: 3900344 (1975-08-01), Magdo
patent: 5665993 (1997-09-01), Keller et al.
patent: 6207538 (2001-03-01), Pan et al.
patent: 6492192 (2002-12-01), O'Toole et al.
patent: 6787910 (2004-09-01), Lee et al.
patent: 6855970 (2005-02-01), Hatakeyama
patent: 2003/0087482 (2003-05-01), Hwang et al.
patent: I242876 (2005-11-01), None
Chinese 4th Examination Report of China Application No. 2006100754875, dated Jun. 19, 2009.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Manufacturing method of integrated circuit structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Manufacturing method of integrated circuit structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manufacturing method of integrated circuit structure will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4081084

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.