Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-01-18
2011-01-18
Tran, Minh-Loan T (Department: 2826)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S211000, C257S314000, C257S900000, C257SE21422, C257SE21640, C257SE29129
Reexamination Certificate
active
07871885
ABSTRACT:
Embodiments relate to a manufacturing method of a flash memory device which improves electrical characteristics by reducing or preventing void generation. A manufacturing method of a flash memory device according to embodiments includes forming a plurality of gate patterns over a semiconductor substrate including a tunnel oxide layer, a floating gate, a dielectric layer, and a control gate. A spacer layer may be formed as a compound insulating layer structure over the side wall of the gate pattern. A source/drain area may be formed over the semiconductor substrate at both sides of the control gate. An insulating layer located at the outermost of the spacer layer may be removed. A contact hole may be formed between the gate patterns by forming and patterning the interlayer insulating layer. A contact plug may be formed in the contact hole.
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Cruz Leslie Pilar
Dongbu Hi-Tek Co., Ltd.
Sherr & Vaughn, PLLC
Tran Minh-Loan T
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