Manufacturing method of a dielectric layer for DRAM capacitors

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438381, 438399, 438398, 438791, 438526, 438530, H01L 218242

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active

061534617

ABSTRACT:
A manufacturing method of a dielectric layer for a dynamic random-access-memory capacitor comprising, at first, providing a substrate which has a first conductive layer for the capacitor implanting ions into the first conductive layer. Next, performing a anneal process so as to form the dielectric layer, and then performing a cleaning process with a resolution. Finally, forming a second conductive layer over the first conductive layer. By the manufacturing steps in this invention, it can reduce a thickness of the dielectric layer and increase the dielectric constant, so that charges which can be stored in per unit area of the capacitor without reducing the integration of the DRAM device. Furthermore, it will not reduce the integration of the DARM device.

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Wolf, S. and Tauber, R. N., Silicon Processing for the VLSI Era vol. 1--Process Technology, Scientific Library U.S.P.T.O. pp. 516-517, 1986.
Wolf, S. Silicon Processing for the VLSI Era vol. 2--Process Integration, Scientific Library U.S.P.T.O. pp. 186-189., 1990.

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