Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Fluid growth from gaseous state combined with preceding...
Reexamination Certificate
2006-06-13
2006-06-13
Smith, Bradley K. (Department: 2891)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Fluid growth from gaseous state combined with preceding...
C257S616000, C257S623000, C117S097000
Reexamination Certificate
active
07060597
ABSTRACT:
A manufacturing method for a silicon substrate having a strained layer, has steps of forming a plurality of atomic steps having a height of 0.1 nm or more on the surface of a silicon substrate, forming a plurality of terraces having a width of 0.1 μm or more between the plurality of atomic steps and forming a SiGe layer or a SiGe layer and a Si layer on the silicon substrate.
REFERENCES:
patent: 5422306 (1995-06-01), Niwa et al.
patent: 6083812 (2000-07-01), Summerfelt
patent: 6121121 (2000-09-01), Koide
patent: 6153010 (2000-11-01), Kiyoku et al.
patent: 6165874 (2000-12-01), Powell et al.
patent: 6180497 (2001-01-01), Sato et al.
patent: 6583015 (2003-06-01), Fitzgerald et al.
patent: 2002/0008289 (2002-01-01), Murota et al.
patent: 2003/0025131 (2003-02-01), Lee et al.
patent: 2004/0142541 (2004-07-01), Cohen et al.
patent: 2004/0259333 (2004-12-01), Tomasini et al.
patent: 6-252046 (1994-09-01), None
patent: 07-037811 (1995-02-01), None
patent: 2003-078116 (2003-03-01), None
patent: 2003-078118 (2003-03-01), None
patent: 2000-0011946 (2000-02-01), None
Igarashi Masato
Izunome Koji
Kurita Hisatsugu
Senda Takeshi
Foley & Lardner LLP
Fulk Steven J
Smith Bradley K.
Toshiba Ceramics Co. Ltd.
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