Maleimide-photoresist monomers containing halogen, polymers...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S905000, C430S907000, C526S242000, C526S262000, C526S281000

Reexamination Certificate

active

06858371

ABSTRACT:
Photoresist monomers, photoresist polymers prepared thereof, and photoresist compositions using the polymer are disclosed. More specifically, photoresist polymers comprising maleimide monomer represented by Formula 1, and a composition comprising the polymer thereof are disclosed. The photoresist composition has excellent etching resistance, heat resistance and adhesiveness, and can be developed in an aqueous tetramethylammonium hydroxide (TMAH) solution. As the composition has low light absorbance at 193 nm and 157 nm wavelength, and it is suitable for a process using ultraviolet light source such as VUV (157 nm)wherein, X1, X2, R1, R2and R3are defined in the specification.

REFERENCES:
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patent: 5059513 (1991-10-01), Hopf et al.
patent: 5558978 (1996-09-01), Schadeli et al.
patent: 6316565 (2001-11-01), Jung et al.
patent: 6406828 (2002-06-01), Szmanda et al.
patent: 07207021 (1995-08-01), None

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