Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2005-10-04
2005-10-04
Fourson, George (Department: 2823)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C257SE21665
Reexamination Certificate
active
06952364
ABSTRACT:
A method for forming an MTJ structure suitable for use in a MRAM device having a bottom electrode including a layer of platinum, ruthenium, iridium, rhodium, osmium, palladium or their oxides and having reduced surface roughness to improve the hysteresis loop characteristics of the resulting MTJ structure. The bottom electrode layer may also combine the functions of both the seeding layer and bottom electrode of the conventional two-layer structure, thereby simplifying the manufacturing process.
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Chung Seok-Jae
Kim Hyun-Jo
Kim Tae-Wan
Lee Kyu-Mann
Park Jeong-Hee
Fourson George
Harness & Dickey & Pierce P.L.C.
Samsung Electronics Co,. Ltd.
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