Low power flash memory devices

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S378000, C257SE29129, C257SE29300, C257SE21422, C257SE21680

Reexamination Certificate

active

11154462

ABSTRACT:
A buried bipolar junction is provided in a floating gate transistor flash memory device. During a write operation electrons are injected into a surface depletion region of the memory cell transistors. These electrons are accelerated in a vertical electric field and injected over a barrier to a floating gate of the cells.

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