Low pin count, high-speed boundary scan testing

Details Low pin count, high-speed boundary scan testing Low pin count, high-speed boundary scan testing

2006-10-17

2006-10-17

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07124340

ABSTRACT:
In a method for testing a testable electronic device having a first and a second plurality of test a arrangements a first shift register (110) is used in parallel with a second shift register (130) to time-multiplex a first test vector (102) and a second test vector (104) into a number of smaller test vectors (102a–c;104a–c) for provision to the first and second plurality of test arrangements. By varying the size of the first shift register (110) and the second shift register (130) a trade-off between the number of pins of the electronic device to be contacted and the required test time can be made. The first shift register (110) may be coupled to a first buffer register (120) and second shift register (130) may be coupled to a second buffer register (140) for enhanced test data stability. First shift register (110) and second shift register (130) can be partitions of a larger shift register. The method can also be used in a reverse way by time-demultiplexing test result vectors into a single vector at the output side of the testable electronic device.

REFERENCES:
patent: 4566104 (1986-01-01), Bradshaw et al.
patent: 5812561 (1998-09-01), Giles et al.
patent: 6061284 (2000-05-01), Dingemanse et al.
patent: 6242269 (2001-06-01), Whetsel
patent: 6430718 (2002-08-01), Nayak
patent: 0388784 (1990-09-01), None

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