Low capacitance ESD protection device, and integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Reexamination Certificate

active

06960811

ABSTRACT:
A low capacitance ESD protection device. The device comprises a substrate, a well of a first conductivity type in the substrate, a first and second transistor of the first conductivity type respectively on two sides of the well, a guard ring of a second conductivity type in the substrate, surrounding the well, and the first and second transistor, and a doped region of the second conductivity type in the well, wherein profiles of a drain and source region of each of the first and second transistor are un-symmetrical, and an area of the drain region is smaller than that of the source region in each of the first and second transistor.

REFERENCES:
patent: 5675168 (1997-10-01), Yamashita et al.
patent: 5714784 (1998-02-01), Ker et al.
patent: 5955763 (1999-09-01), Lin
patent: 6097066 (2000-08-01), Lee et al.
patent: 6259139 (2001-07-01), Pan
patent: 6420761 (2002-07-01), Gauthier et al.
patent: 6448123 (2002-09-01), Lee et al.
patent: 6611025 (2003-08-01), Lin
patent: 6621133 (2003-09-01), Chen et al.
patent: 6784498 (2004-08-01), Lee et al.
patent: 2003/0047786 (2003-03-01), Lee et al.
“ESD Reliability Issues in RF CMOS Circuits” Radhakrishnan, et al., IMEC Website, Mar. 2002, 6 pages.

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