Locating hold time violations in scan chains by generating...

Details Locating hold time violations in scan chains by generating... Locating hold time violations in scan chains by generating...

2007-10-31

2010-12-14

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S715000, C714S724000, C714S727000, C714S728000, C714S729000, C714S006130, C714S025000, C714S030000, C714S032000, C714S719000, C714S720000, C714S735000, C714S818000, C714S824000, C716S030000

Reexamination Certificate

active

07853846

ABSTRACT:
A method for determining that failures in semiconductor test are due to a defect potentially causing a hold time violation in a scan cell in a scan chain, counting the number of potential defects, and, if possible, localizing, and ameliorating hold time defects in a scan chain.

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International Search Report and Written Opinion for International Application No. PCT/US08/82088 mailed on Feb. 13, 2009.

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