Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-07-31
2009-02-17
Yoha, Connie C (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S189050, C365S189200
Reexamination Certificate
active
07492625
ABSTRACT:
A loadless static random access memory (SRAM) may have transfer transistors with at least two threshold voltages. In some embodiments, the transfer transistors may have gate structures with different portions that produce electric fields in different directions. In some embodiments the transfer gate structures may extend down the sidewalls of an active region. In other embodiments, the transfer transistors may have gate structures with different portions that have different gate lengths.
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English language abstract of Japanese Publication No. 6-338601.
English language abstract of Japanese Publication No. 2000-124333.
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
Yoha Connie C
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