Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1989-11-30
1992-05-12
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430394, 430494, 430942, G03C 500
Patent
active
051127245
ABSTRACT:
An electron beam lithography method with multiple low-dose scans by an electron beam (320) exposes a resist (402) pattern.
REFERENCES:
patent: 4504558 (1985-03-01), Bohlen et al.
Howard et al, "Nanometer-Scale Fabrication Techniques", Academic Press 1982, VLSI Electronics: Microstructure Science, vol. 5, pp. 145-189.
Bowers Jr. Charles L.
Donaldson Richard L.
Grossman Rene E.
Stoltz Richard A.
Texas Instruments Incorporated
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