Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2005-12-28
2008-12-23
Nguyen, Hung Henry (Department: 2851)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S50400H, C355S030000
Reexamination Certificate
active
07468521
ABSTRACT:
A lithographic apparatus includes a radiation system for providing a beam of radiation. The radiation system includes at least one of a contaminant trap for trapping material emanating from the radiation source and a collector for collecting the beam of radiation. The at least one of the contaminant trap and the collector includes an element arranged in the path of the radiation beam on which the material emanating from the radiation source can deposit during propagation of the radiation beam in the radiation system. At least a part of the element disposed in the path of the radiation beam has a surface that has a highly specular grazing incidence reflectivity to reduce the absorption of the radiation beam in a direction of propagation of the radiation beam substantially non-parallel to the surface of the element, so that a thermal load experienced by the element is reduced.
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Bakker Levinus Pieter
Banine Vadim Yevgenyevich
Klunder Derk Jan Wilfred
Schuurmans Frank Jeroen Pieter
Van Herpen Maarten Marinus Johannes Wilhelmus
ASML Netherlands B.V.
Nguyen Hung Henry
Pillsbury Winthrop Shaw & Pittman LLP
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