Like integrated circuit devices with different depth

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C438S424000, C438S444000, C438S706000

Reexamination Certificate

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11162766

ABSTRACT:
The invention forms integrated circuit devices of similar structure and dissimilar depth, such as interconnects and inductors, simultaneously. The invention deposits a conformal polymer over an area on a substrate with vias and an area without vias. Simultaneously, cavities are formed in the areas with and without vias. The depth of the cavities formed in the areas with vias will extend deeper into the substrate than the cavities formed in areas without vias. Such occurs because the polymer deposits unevenly along the surface of the substrate and more specifically, more thinly in areas with underlying depressions. Once filled with a conductive material, cavities which extend more deeply into the substrate, which were formed in areas with vias, become inductors, and the cavities which extend less deeply into the substrate, which were formed in areas without vias, become interconnects.

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“High-Q Inductors in Standard Silicon Interconnect Technology and its Application to an Integrated RF Power Amplifier”, Burghartz, et al, Electron Devices Meeting, 1995. International Washington, DC, USA 10-13, IEEE, Dec. 1995, New York, NY, USA, Dec. 10, 1995, pp. 1015-1017.

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