Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-06-26
2007-06-26
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
10982111
ABSTRACT:
An apparatus, a method and a computer program are provided to reduce leakage current in a processor. Traditionally, extra logic is employed to reduce leakage currents. However, reducing leakage current without sacrificing fine grain operations and speed can be difficult. Achieving such a goal can be accomplished by incorporating a multiplexer (mux) into the scan-in path of scan registers so that units or sub-units of the processor can be powered down individually. Additionally, the muxes are not incorporated into time paths, so speed can be preserved.
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patent: 6622273 (2003-09-01), Barnes
patent: 6671841 (2003-12-01), Golshan
Abdollahai, A. and Fallah, F. and Pedram, M., “Leakage Current Reduction in Sequential Circuits by Modifying Scan Chains”,Proceedings of the 4thInternational Symposium on Quality Electronic Design(ISQED'03), 2003, IEEE.
Dhong Sang Hoo
Mueller Silvia Melitta
Oh Hwa-Joon
Silberman Joel
Carr LLP
International Business Machines - Corporation
Rifai D'Ann N.
Tu Christine T.
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