Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2011-04-19
2011-04-19
Graybill, David E (Department: 2894)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C219S121800, C257SE21134
Reexamination Certificate
active
07927983
ABSTRACT:
Attenuation regions of laser light are removed or reduced in size using a slit located in the immediate vicinity of a surface to be irradiated so that a steep energy distribution is obtained in the end portions of the laser light. The reason why the slit is located in the immediate vicinity of the surface to be irradiated is to suppress the spread of the laser light. In addition, the attenuation regions of the laser light are folded by using a mirror instead of the slit to increase energy densities in the attenuation regions by one another so that a steep energy density distribution is obtained in the end portions of the laser light.
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Australian Patent Office Search Report and Written Opinion mailed Sep. 6, 2004, from the Singapore Patent Office for Singapore Application No. 200204790-0.
Office Action (Application No. 200410007410.5; CN6914)Dated Jul. 6, 2007.
Moriwaka Tomoaki
Tanaka Koichiro
Costellia Jeffrey L.
Graybill David E
Nixon & Peabody LLP
Semiconductor Energy Laboratory Co,. Ltd.
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