Laser annealing method and laser annealing device

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C438S905000, C438S166000, C438S509000, C438S795000, C117S008000, C117S009000, C117S010000

Reexamination Certificate

active

07041580

ABSTRACT:
A laser-annealing method includes the steps of a first step of cleaning a non-monocrystal silicon film formed on a substrate, and a second step of laser-annealing the non-monocrystal silicon film in an atmosphere containing oxygen therein, wherein the first and second steps are conducted continuously without being exposed to the air. Also, a laser-annealing device includes a cleaning chamber, and a laser irradiation chamber, wherein a substrate to be processed is transported between the cleaning chamber and the laser irradiation chamber without being exposed to the air.

REFERENCES:
patent: 4292093 (1981-09-01), Ownby et al.
patent: 4552595 (1985-11-01), Hoga
patent: 4559091 (1985-12-01), Allen et al.
patent: 4795679 (1989-01-01), Ramesh et al.
patent: 4863561 (1989-09-01), Freeman et al.
patent: 4942058 (1990-07-01), Sano
patent: 5024968 (1991-06-01), Engelsberg
patent: 5326406 (1994-07-01), Kaneko et al.
patent: 5352291 (1994-10-01), Zhang et al.
patent: 5365875 (1994-11-01), Asai et al.
patent: 5372836 (1994-12-01), Imahashi et al.
patent: 5382316 (1995-01-01), Hills et al.
patent: 5405804 (1995-04-01), Yabe
patent: 5413958 (1995-05-01), Imahashi et al.
patent: 5424244 (1995-06-01), Zhang et al.
patent: 5529630 (1996-06-01), Imahashi et al.
patent: 5593497 (1997-01-01), Matsuyama et al.
patent: 5612250 (1997-03-01), Ohtani et al.
patent: 5620910 (1997-04-01), Teramoto
patent: 5622595 (1997-04-01), Gupta et al.
patent: 5648282 (1997-07-01), Yoneda
patent: 5669979 (1997-09-01), Elliott et al.
patent: 5795795 (1998-08-01), Kousai et al.
patent: 5843225 (1998-12-01), Takayama et al.
patent: 5843833 (1998-12-01), Ohtani et al.
patent: 5854096 (1998-12-01), Ohtani et al.
patent: 5861337 (1999-01-01), Zhang et al.
patent: 5958268 (1999-09-01), Engelsberg et al.
patent: RE36371 (1999-11-01), Imahashi et al.
patent: 6027960 (2000-02-01), Kusumoto et al.
patent: 6162667 (2000-12-01), Funai et al.
patent: 6184068 (2001-02-01), Ohtani et al.
patent: 6326248 (2001-12-01), Ohtani et al.
patent: 6589824 (2003-07-01), Ohtani et al.
patent: 6897100 (2005-05-01), Yamazaki et al.
patent: 2004/0005742 (2004-01-01), Ohtani et al.
patent: 58-015227 (1983-01-01), None
patent: 05-275336 (1993-10-01), None
Ghandhi et al., VLSI Fabrication Principles, 1983 John Wiley and Sons, Inc., pp. 517-520.
Tam, A. et al., Laser-cleaning techniques for removal of surface particulates, J. Appl. Phys. 71 (7), Apr. 1992, pp. 3515-3523.
Brotherton, et al., “Excimer-Laser-Annealed Poly-Si Thin-Film Transistors”, IEEE Transactions On Electron Devices, vol. 40, No. 2, Feb. 1993, pp. 407-413.
Kubo, et al., “Characteristics of Polycrystalline-Si Thin Film Transistors Fabricated by Excimer Laser Annealing Method”, IEEE Transactions On Electron Devices, vol. 41, No. 10, Oct. 1994, pp. 1876-1879.
Kohno, et al., “High Performance Poly-Si TFTs Fabricated Using Pulsed Laser Annealing and Remote Plasma CVD with Low Temperature Processing”, IEEE Transactions On Electron Devices, vol. 42, No. 2, Feb. 1995, pp. 251-257.

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