Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2006-05-09
2006-05-09
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S905000, C438S166000, C438S509000, C438S795000, C117S008000, C117S009000, C117S010000
Reexamination Certificate
active
07041580
ABSTRACT:
A laser-annealing method includes the steps of a first step of cleaning a non-monocrystal silicon film formed on a substrate, and a second step of laser-annealing the non-monocrystal silicon film in an atmosphere containing oxygen therein, wherein the first and second steps are conducted continuously without being exposed to the air. Also, a laser-annealing device includes a cleaning chamber, and a laser irradiation chamber, wherein a substrate to be processed is transported between the cleaning chamber and the laser irradiation chamber without being exposed to the air.
REFERENCES:
patent: 4292093 (1981-09-01), Ownby et al.
patent: 4552595 (1985-11-01), Hoga
patent: 4559091 (1985-12-01), Allen et al.
patent: 4795679 (1989-01-01), Ramesh et al.
patent: 4863561 (1989-09-01), Freeman et al.
patent: 4942058 (1990-07-01), Sano
patent: 5024968 (1991-06-01), Engelsberg
patent: 5326406 (1994-07-01), Kaneko et al.
patent: 5352291 (1994-10-01), Zhang et al.
patent: 5365875 (1994-11-01), Asai et al.
patent: 5372836 (1994-12-01), Imahashi et al.
patent: 5382316 (1995-01-01), Hills et al.
patent: 5405804 (1995-04-01), Yabe
patent: 5413958 (1995-05-01), Imahashi et al.
patent: 5424244 (1995-06-01), Zhang et al.
patent: 5529630 (1996-06-01), Imahashi et al.
patent: 5593497 (1997-01-01), Matsuyama et al.
patent: 5612250 (1997-03-01), Ohtani et al.
patent: 5620910 (1997-04-01), Teramoto
patent: 5622595 (1997-04-01), Gupta et al.
patent: 5648282 (1997-07-01), Yoneda
patent: 5669979 (1997-09-01), Elliott et al.
patent: 5795795 (1998-08-01), Kousai et al.
patent: 5843225 (1998-12-01), Takayama et al.
patent: 5843833 (1998-12-01), Ohtani et al.
patent: 5854096 (1998-12-01), Ohtani et al.
patent: 5861337 (1999-01-01), Zhang et al.
patent: 5958268 (1999-09-01), Engelsberg et al.
patent: RE36371 (1999-11-01), Imahashi et al.
patent: 6027960 (2000-02-01), Kusumoto et al.
patent: 6162667 (2000-12-01), Funai et al.
patent: 6184068 (2001-02-01), Ohtani et al.
patent: 6326248 (2001-12-01), Ohtani et al.
patent: 6589824 (2003-07-01), Ohtani et al.
patent: 6897100 (2005-05-01), Yamazaki et al.
patent: 2004/0005742 (2004-01-01), Ohtani et al.
patent: 58-015227 (1983-01-01), None
patent: 05-275336 (1993-10-01), None
Ghandhi et al., VLSI Fabrication Principles, 1983 John Wiley and Sons, Inc., pp. 517-520.
Tam, A. et al., Laser-cleaning techniques for removal of surface particulates, J. Appl. Phys. 71 (7), Apr. 1992, pp. 3515-3523.
Brotherton, et al., “Excimer-Laser-Annealed Poly-Si Thin-Film Transistors”, IEEE Transactions On Electron Devices, vol. 40, No. 2, Feb. 1993, pp. 407-413.
Kubo, et al., “Characteristics of Polycrystalline-Si Thin Film Transistors Fabricated by Excimer Laser Annealing Method”, IEEE Transactions On Electron Devices, vol. 41, No. 10, Oct. 1994, pp. 1876-1879.
Kohno, et al., “High Performance Poly-Si TFTs Fabricated Using Pulsed Laser Annealing and Remote Plasma CVD with Low Temperature Processing”, IEEE Transactions On Electron Devices, vol. 42, No. 2, Feb. 1995, pp. 251-257.
Kusumoto Naoto
Takayama Toru
Yonezawa Masato
Fish & Richardson P.C.
Fourson George
Maldonado Julio J.
Semiconductor Energy Laboratory Co,. Ltd.
LandOfFree
Laser annealing method and laser annealing device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Laser annealing method and laser annealing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Laser annealing method and laser annealing device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3570612