JTAG interface using existing I/O bus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S726000

Reexamination Certificate

active

07447962

ABSTRACT:
A plurality of input circuits and a plurality of output circuits are connected to form a Boundary Scan Path Chain (BSPC). Part or all of the existing I/O bus is used as a test bus. When a test target system such as a logic circuit is tested, data of the input circuits is circulated in the BSPC to set the initial state. After a system clock is activated, data of the input circuits is loaded into shift registers provided in the input circuits or data of the output circuits is loaded into shift registers provided in the output circuits. A shift clock is activated to extract the data of the input or output circuits through the BSPC. Enable data is circulated in the BSPC, and data of the output circuits is supplied to the test bus only when the enable data is active.

REFERENCES:
patent: 5477545 (1995-12-01), Huang
patent: 5487074 (1996-01-01), Sullivan
patent: 6539536 (2003-03-01), Singh et al.
patent: 6988232 (2006-01-01), Ricchetti et al.
patent: 7159159 (2007-01-01), Sunter
patent: 2005/0204225 (2005-09-01), Whetsel
patent: 09-015300 (1997-01-01), None
patent: 11-326460 (1999-11-01), None

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