Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-10-21
2008-11-04
Louis-Jacques, Jacques (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S726000
Reexamination Certificate
active
07447962
ABSTRACT:
A plurality of input circuits and a plurality of output circuits are connected to form a Boundary Scan Path Chain (BSPC). Part or all of the existing I/O bus is used as a test bus. When a test target system such as a logic circuit is tested, data of the input circuits is circulated in the BSPC to set the initial state. After a system clock is activated, data of the input circuits is loaded into shift registers provided in the input circuits or data of the output circuits is loaded into shift registers provided in the output circuits. A shift clock is activated to extract the data of the input or output circuits through the BSPC. Enable data is circulated in the BSPC, and data of the output circuits is supplied to the test bus only when the enable data is active.
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patent: 6539536 (2003-03-01), Singh et al.
patent: 6988232 (2006-01-01), Ricchetti et al.
patent: 7159159 (2007-01-01), Sunter
patent: 2005/0204225 (2005-09-01), Whetsel
patent: 09-015300 (1997-01-01), None
patent: 11-326460 (1999-11-01), None
Louis-Jacques Jacques
Nguyen Steve
Oki Electric Industry Co. Ltd.
Rabin & Berdo P.C.
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