JTAG interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S724000

Reexamination Certificate

active

07747916

ABSTRACT:
Implementations are presented herein that relate to improved Joint Test Action Group (JTAG) compatible devices.

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Tietze et al, “Halbleiter-Schaltungstechnik” 8th revised edition, Springer-Verlag 1986, Berlin, 1986, pp. 222-224.
“IEEE Standard Test Access Port and Boundary-Scan Architecture”, Test Technology Standards Committee of the IEEE Computer Society, IEEE Std 1149.1—Feb. 15, 1990 (includes Std 1149.1a—Jun. 17, 1993), The Institute of Electrical and Electronics Engineers, Inc., Copy right 1993, pp. 1-1 to 1-5, 3-1 to 3-9, 4-1 to 4-3, 5-1 to 5-16, and 8-1 to 8-3.

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