Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-08-23
2005-08-23
Assouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S226000
Reexamination Certificate
active
06934648
ABSTRACT:
A jitter measurement circuit includes: a conversion section sampling one of a reference signal and a measurement target signal in response to the other of the signals, thereby obtaining a sampling data string; and a determination section measuring jitter of the measurement target signal on the basis of the sampling data string obtained by the conversion section. Since the reference signal is a stable signal having a predetermined cycle, the sampling data string as a measurement result depends on the measurement target signal. Therefore, it is possible to simply measure jitter level in accordance with irregularity of the measurement result and on the basis of relative measurement to expected value data.
REFERENCES:
patent: 5557196 (1996-09-01), Ujiie
patent: 6167359 (2000-12-01), Demir et al.
patent: 6240130 (2001-05-01), Burns et al.
patent: 6356850 (2002-03-01), Wilstrup et al.
patent: 6366374 (2002-04-01), Bradshaw et al.
patent: 6460001 (2002-10-01), Yamaguchi et al.
patent: 6519281 (2003-02-01), Taylor
patent: 6525523 (2003-02-01), Soma et al.
patent: 6598004 (2003-07-01), Ishida et al.
patent: 6621860 (2003-09-01), Yamaguchi et al.
patent: 6640193 (2003-10-01), Kuyel
patent: 6735538 (2004-05-01), Yamaguchi et al.
patent: 6775321 (2004-08-01), Soma et al.
patent: 2001/0037189 (2001-11-01), Unu et al.
patent: 2002/0075951 (2002-06-01), Pearson
patent: 2002/0103609 (2002-08-01), Kuyel
patent: 2002/0136337 (2002-09-01), Chatterjee et al.
patent: 2003/0125888 (2003-07-01), Yamaguchi et al.
patent: 2003/0156673 (2003-08-01), Yanai
patent: 2003/0202573 (2003-10-01), Yamaguchi et al.
patent: 2003/0210029 (2003-11-01), Antheunisse et al.
patent: 2003/0219086 (2003-11-01), LeCheminant et al.
patent: 2004/0059524 (2004-03-01), Watson et al.
patent: 2004/0061488 (2004-04-01), Rosenbaum et al.
patent: 2004/0062301 (2004-04-01), Yamaguchi et al.
patent: 2000-292469 (2000-10-01), None
Funakura Teruhiko
Hanai Hisayoshi
Mori Hisaya
Assouad Patrick J.
Leydig , Voit & Mayer, Ltd.
Renesas Technology Corp.
Ryoden Semiconductor System Engineering Corporation
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