4. Coded data generation or conversion
  5. Converter calibration or testing

Hisayoshi Hanai

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Apparatus for testing semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Jitter measurement circuit for measuring jitter of...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Semiconductor tester, and method of testing semiconductor...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Test system and testing method using memory tester

Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate

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Tester for semiconductor integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-2539243

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