4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Having specific delay in producing output waveform

Teruhiko Funakura

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Apparatus and method for testing semiconductor integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus and method for testing semiconductor integrated...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Apparatus and method for testing semiconductor integrated...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Apparatus for testing semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Apparatus for testing semiconductor integrated circuit

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-519533

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