Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-03-08
2011-03-08
Beausoliel, Robert (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S733000
Reexamination Certificate
active
07904776
ABSTRACT:
Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that are connected in a cascading manner and that each sequentially delay a supplied reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.
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Ichiyama Kiyotaka
Ishida Masahiro
Advantest Corporation
Beausoliel Robert
Gandhi Dipakkumar
Osha & Liang LLP
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