Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2006-05-30
2006-05-30
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C438S480000, C438S766000
Reexamination Certificate
active
07052981
ABSTRACT:
Disclosed is an ion implantation method capable of preventing a channeling phenomenon caused by a lattice structure of a semiconductor substrate. The ion implantation method includes the steps of forming a predetermined mask pattern on the semiconductor substrate, performing an ion implantation process with respect to the semiconductor substrate exposed by the predetermined mask without forming a tilt angle, thereby forming an impurity area in the semiconductor substrate, and applying vibration to a lattice structure of the semiconductor substrate when the ion implantation process is carried out with respect to the semiconductor substrate.
REFERENCES:
patent: 4253888 (1981-03-01), Kikuchi
patent: 6869865 (2005-03-01), Maegawa et al.
Jin Seung Woo
Kim Bong Soo
Rouh Kyoung Bong
Hynix / Semiconductor Inc.
Ladas & Parry LLP
Smith Zandra V.
Tran Thanh Y.
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