Internal voltage generating circuit

Details Internal voltage generating circuit Internal voltage generating circuit

1992-08-18

1994-09-20

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

365226, 3072966, G11C 2900

Patent

active

053495594

ABSTRACT:
A circuit for generating an internal voltage to be supplied to memory elements of a semiconductor memory chip during normal operation and for providing an external voltage to the memory elements during a burn-in test operation. The circuit may be constructed with a driver circuit (50) which receives an external voltage and is controlled to generate the internal voltage. A comparator (300) compares the internal voltage to a first reference voltage to produce a control signal G2 to control the driver circuit (50). An external voltage detector (100) compares a second reference voltage to the external voltage to generate control signal B2. A driver control circuit (200) is enabled by control signal B2, if the external voltage is less than the second reference voltage, to pass control signal G2 to the driver circuit and thereby enable generation of the internal voltage to be equal to, or less than, the operating voltage of the semiconductor memory chip. The driver control circuit is disabled by control signal B2 if the external voltage is greater than the second reference voltage, thereby preventing the control signal G2 of the comparator from controlling conduction by the driver circuit (50) to enable output of the external voltage exhibiting an elevated amplitude to the memory elements for burn-in test operation.

REFERENCES:
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patent: 4670861 (1987-06-01), Shu et al.
patent: 4797377 (1989-01-01), Hing
patent: 4868483 (1989-09-01), Tsujimoto
patent: 5046052 (1991-09-01), Miyaji et al.
patent: 5063304 (1991-02-01), Iyengar
patent: 5128863 (1992-07-01), Nakamura et al.
patent: 5249155 (1993-09-01), Arimoto et al.

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