4. Static information storage and retrieval
  5. Read/write circuit
  6. Having fuse element

L. Owen Farnsworth, III

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Internal cache for on chip test data storage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Method for optimizing a set of scan diagnostic patterns

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Method of electrically blowing fuses under control of an...

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2688559

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