Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2005-09-01
2008-10-07
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S499000, C250S23700G
Reexamination Certificate
active
07433048
ABSTRACT:
Interferometer systems for measuring displacement include a displacement interferometer. This interferometer includes a displacement converter responsive to a measuring beam of light. The displacement converter is configured to transform movement thereof in a direction orthogonal to the measuring beam of light into a change in path length between a reflective surface of the displacement converter and the measuring beam of light. The displacement converter may include a transmission grating and a displacement mirror or a reflecting grating.
REFERENCES:
patent: 3891321 (1975-06-01), Hock
patent: 4436424 (1984-03-01), Bunkenburg
patent: 4815850 (1989-03-01), Kanayama et al.
patent: 5404220 (1995-04-01), Takeuchi et al.
patent: 5838450 (1998-11-01), McCoy et al.
patent: 6282011 (2001-08-01), Tearney et al.
patent: 6295132 (2001-09-01), Drabarek
patent: 6583873 (2003-06-01), Goncharov et al.
patent: 6639686 (2003-10-01), Ohara
patent: 2003/0053074 (2003-03-01), Hill
patent: 2004/0135980 (2004-07-01), Hill
patent: 3715864 (1987-11-01), None
patent: 196 15 616 (1997-10-01), None
patent: 199 33 290 (2001-03-01), None
patent: 10256278 (2004-06-01), None
patent: 69820856 (2004-12-01), None
patent: 0309281 (1995-03-01), None
patent: 2 170 005 (1986-07-01), None
patent: 04-179115 (1992-06-01), None
patent: 2000-039305 (2000-02-01), None
patent: 2000-349020 (2000-12-01), None
patent: 2001-307983 (2001-11-01), None
patent: 1020000031172 (2000-06-01), None
patent: 1020000070669 (2002-12-01), None
patent: 1020030039676 (2003-05-01), None
Office Action (Translation), German Patent Application No. 102005047162.5-52, Jan. 26, 2007.
Search Report (Partial), German Patent Application No. 1030035, Sep. 21, 2006.
Connolly Patrick J
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
LandOfFree
Interferometer systems for measuring displacement and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Interferometer systems for measuring displacement and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometer systems for measuring displacement and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3998947