Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-08-09
2005-08-09
Pham, Hoai (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S396000
Reexamination Certificate
active
06927125
ABSTRACT:
The present invention provides a method of manufacturing an interdigitated semiconductor device. In one embodiment, the method comprises simultaneously forming first electrodes adjacent each other on a substrate, forming a dielectric layer between the first electrodes, and creating a second electrode between the first electrodes, the second electrode contacting the dielectric layer between the first electrodes to thereby form adjacent interdigitated electrodes. An interdigitated capacitor and a method of manufacturing an integrated circuit having an interdigitated capacitor are also disclosed.
REFERENCES:
patent: 4409608 (1983-10-01), Yoder
patent: 5393373 (1995-02-01), Jun et al.
patent: 5527730 (1996-06-01), Kayaoka et al.
patent: 5744853 (1998-04-01), Quek et al.
patent: 6150706 (2000-11-01), Thakur et al.
patent: 6383858 (2002-05-01), Gupta et al.
patent: 6436787 (2002-08-01), Shih et al.
Parent U.S. Appl. No. 09/929,188 filed Aug. 14, 2001 to Christopher DW Jones, et al, entitled “Interdigitated Capacitor and Method of Manufacturing Thereof”; allowed Jan. 5, 2004.
Jones Christopher D. W.
Murphy Donald W.
Wong Yiu-Huen
Agere Systems Inc.
Pham Hoai
LandOfFree
Interdigitated capacitor and method of manufacturing thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Interdigitated capacitor and method of manufacturing thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interdigitated capacitor and method of manufacturing thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3503550