Interconnection process

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S629000, C438S597000, C257SE21585

Reexamination Certificate

active

07625819

ABSTRACT:
An interconnection process is provided. The process includes the following steps. Firstly, a semiconductor base having at least a electrical conductive region is provided. Next, a dielectric layer with a contact hole is formed to cover the semiconductor base, wherein the contact hole exposes part of the electrical conductive region. Then, a thermal process is performed on the semiconductor base covered with the dielectric layer. Lastly, a conductive layer is formed on the dielectric layer, wherein the conductive layer is electrically connected to the electrical conductive region through the contact hole.

REFERENCES:
patent: 6169019 (2001-01-01), Takagi
patent: 2004/0207045 (2004-10-01), Imoto
patent: 2004/0256351 (2004-12-01), Chung et al.
patent: 2005/0020093 (2005-01-01), Ahn et al.
patent: 2005/0221612 (2005-10-01), Brown et al.

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