Interconnect structures with encasing cap and methods of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S680000, C438S687000, C257SE21006, C257SE21170, C257SE21278, C257SE21293, C257SE21311

Reexamination Certificate

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07902061

ABSTRACT:
A method of making an interconnect structure: which includes providing an interconnect structure in a dielectric material, recessing the dielectric material such that a portion of the interconnect structure extends above an upper surface of the dielectric material; and depositing an encasing cap over the extended portion of the interconnect structure.

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