Inter-metal dielectric of semiconductor device and...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers

Reexamination Certificate

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C438S758000, C438S775000, C438S791000, C257S687000, C257S789000, C257S791000, C257SE23077, C257SE23132

Reexamination Certificate

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07442653

ABSTRACT:
An exemplary manufacturing method of an inter-metal dielectric of a semiconductor device according to an embodiment of the present invention includes forming a first silicon-rich oxide (SRO) layer on a silicon substrate provided with or otherwise having a copper line layer therein, forming a plasma enhanced fluorosilicate glass (PEFSG) layer on the first SRO layer, plasma-treating the PEFSG layer, and forming a second SRO layer on the plasma-treated PEFSG layer. According to the present invention, the thickness of the second SRO layer of the inter-metal dielectric can be reduced. Consequently, process cost can be reduced, and the total thickness of the inter-metal dielectric can be reduced so as to lower the dielectric constant thereof, reduce the aspect ratio of any via holes that are subsequently formed in the inter-metal dielectric, and potentially increase the yield as a result of the reduced via hole aspect ratio.

REFERENCES:
patent: 6136680 (2000-10-01), Lai et al.
patent: 6284644 (2001-09-01), Aug et al.
patent: 6335274 (2002-01-01), Wu et al.
patent: 7186640 (2007-03-01), Huang et al.
patent: 2004/0048468 (2004-03-01), Liu et al.

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