Integrated semiconductor memory device capable of switching from

Static information storage and retrieval – Read/write circuit – Testing

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371 225, 371 15, G11C 700, G11C 2900

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active

054973503

ABSTRACT:
A semiconductor memory is subdivided into a plurality of function units and has m leads addressable from outside, internal signal lines leading from the function units to the leads, internal signal lines connecting the function units with one another, and a test unit recognizing a test mode from a code word applied to k leads, where k.ltoreq.m. A device switches over from a memory mode to the test mode. The test unit decouples at least one of the signal lines leading to the leads from an associated lead of the semiconductor memory and connects the lead to an internal signal line connecting the function units.

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