Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Patent
1998-10-20
2000-12-05
Rosasco, S.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
310344, G03C 500, H01L 4104
Patent
active
061564834
ABSTRACT:
In a method of manufacturing an integrated optical device using a wafer of lithium niobate, an optical waveguide is formed in the wafer by diffusing from a surface thereof a metal such as titanium, nickel or zinc and which changes the refractive index of the lithium niobate. A chemical vapor deposition process is used to deposit on the wafer surface a silicon dioxide buffer layer, the process being operated with the temperature of the wafer substantially in the region of about 170.degree. C. to 225.degree. C. A metallic electrode array is deposited on the silicon dioxide buffer layer, and then the wafer is mounted in a package, with suitable optic and electric connections being made thereto. The package is hermetically sealed to protect the connected wafer from the environment.
REFERENCES:
patent: 4119363 (1978-10-01), Camlibel
patent: 5068865 (1991-11-01), Ohshima et al.
patent: 5925973 (1999-07-01), Eda et al.
Croston Ian
McCoy Michael Anthony
Rosasco S.
SDL Integrated Optics Limited
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