Integrated circuit with embedded test functionality

Details Integrated circuit with embedded test functionality Integrated circuit with embedded test functionality

2005-06-27

2010-02-02

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000, C714S724000, C714S726000

Reexamination Certificate

active

07657807

ABSTRACT:
An integrated circuit including embedded test functionality. An integrated circuit may include a plurality of processor cores each configured to execute instructions, and a test access port configured to interface circuits included within the integrated circuit with a test environment external to the integrated circuit for testing of the circuits. The test access port may include virtualization logic configured to allow a first set of instructions executing on the given processor core to control activity of the test access port for testing of the circuits. In one embodiment, the circuits may be accessible for testing via a plurality of scan chains, wherein the scan chains and the test access port are compliant with a version of Joint Test Access Group (JTAG) standard IEEE 1149, and wherein the test access port includes a Test Data In (TDI) pin, a Test Data Out (TDO) pin, and a Test Clock (TCK) pin.

REFERENCES:
patent: 5130988 (1992-07-01), Wilcox et al.
patent: 5477548 (1995-12-01), Beenker et al.
patent: 5673276 (1997-09-01), Jarwala et al.
patent: 6070252 (2000-05-01), Xu et al.
patent: 6115763 (2000-09-01), Douskey et al.
patent: 6311302 (2001-10-01), Adusumilli et al.
patent: 6385749 (2002-05-01), Adusumilli et al.
patent: 6587981 (2003-07-01), Muradali et al.
patent: 6681238 (2004-01-01), Brice, Jr. et al.
patent: 6691270 (2004-02-01), Blasco et al.
patent: 6728916 (2004-04-01), Chen et al.
patent: 6804725 (2004-10-01), Whetsel
patent: 6981083 (2005-12-01), Arimilli et al.
patent: 7076575 (2006-07-01), Baitinger et al.
patent: 7117389 (2006-10-01), Luick
patent: 7155370 (2006-12-01), Nejedlo
patent: 7197647 (2007-03-01), Van Essen et al.
patent: 7213171 (2007-05-01), Haroun et
patent: 7240267 (2007-07-01), Jayabharathi
patent: 7246282 (2007-07-01), Chau et al.
patent: 2003/0046625 (2003-03-01), Menon et al.
patent: 2004/0111591 (2004-06-01), Arimilli et al.
patent: 2004/0123168 (2004-06-01), Joo et al.
patent: 2004/0186688 (2004-09-01), Nejedlo
patent: 2004/0187056 (2004-09-01), Whetsel
patent: 2005/0022065 (2005-01-01), Dixon et al.
patent: 2005/0066079 (2005-03-01), Luick
patent: 2005/0076280 (2005-04-01), Martinez
patent: 2005/0108600 (2005-05-01), Arguelles
patent: 2005/0120269 (2005-06-01), Larson et al.
patent: 2005/0182788 (2005-08-01), Arndt et al.
patent: 2005/0193293 (2005-09-01), Shikata
patent: 2005/0232159 (2005-10-01), Joo et al.
patent: 2005/0240850 (2005-10-01), Ohwada et al.
patent: 2005/0257087 (2005-11-01), Goff
patent: 2005/0283637 (2005-12-01), Coldicott et al.
patent: 2006/0004942 (2006-01-01), Hetherington et al.
patent: 2006/0107160 (2006-05-01), Ricchetti et al.
patent: 2006/0117235 (2006-06-01), Jayabharathi
patent: 2006/0156098 (2006-07-01), Bawany et al.
patent: 2006/0248426 (2006-11-01), Miner et al.
patent: 2006/0259818 (2006-11-01), Howell et al.
patent: 2007/0028244 (2007-02-01), Landis et al.
Texas Instruments IEEE Std 1149.1 (JTAG) Testability Primer, 1997, 146 pages.
Waayers, “An Improved Test Control Architecture and Test Control Expansion For Core-Based System Chips,” Proceedings of the International Test Conference (ITC) 2003, 10 pages.

Affiliated with

Also associated with

Rating

Integrated circuit with embedded test functionality does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit with embedded test functionality, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit with embedded test functionality will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4206618