Integrated circuit testing module including data compression

Details Integrated circuit testing module including data compression Integrated circuit testing module including data compression

2008-05-06

2008-05-06

Tu, Christine T. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S732000, C714S798000

Reexamination Certificate

active

07370256

ABSTRACT:
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment is configured to operate. In order to do so, the testing interface includes components configured for generating addresses and test data to be provided to the integrated circuit. A variety of test data patterns can be produced and the test data can be address dependent.

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