Integrated circuit module fixing mechanism for temperature cycli

Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...

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248500, 437 8, 206710, 432253, 414586, 414222, G01N 1700, G01N 360

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active

057527717

ABSTRACT:
An apparatus to retain integrated circuit modules during the preparation for a cycling of temperature, during the cycling of temperature, and during the post-handling after the cycling of temperature, is described. The apparatus has a specimen basket to contain the integrated circuit modules, a plurality of specimen retaining rods coupled to the specimen basket to prevent the integrated circuit modules from movement within the basket, a plurality of integrated circuit module retaining means coupled to the specimen retaining rods to secure each of the integrated circuit modules within the specimen basket, and a specimen securing rod retaining means to fasten each of the specimen retaining rods to the specimen basket.

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