Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-04-23
2010-11-16
Ngo, Ngan (Department: 2893)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257SE29129, C257SE29300, C257SE21179, C438S257000
Reexamination Certificate
active
07834391
ABSTRACT:
Coupling among adjacent rows of memory cells on an integrated circuit substrate may reduced by forming the adjacent rows of memory cells on adjacent semiconductor pedestals that extend different distances away from the integrated circuit substrate. NAND flash memory devices that include different pedestal heights and fabrication methods for integrated circuit memory devices are also disclosed.
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Search Report under Section 17, GB Application No. GB0812997.5, Oct. 26, 2008.
Kang Hee-Soo
Lee Choong-Ho
Myers Bigel Sibley & Sajovec P.A.
Ngo Ngan
Samsung Electronics Co,. Ltd.
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